6 ways VRAD saves you time and money:

- Source code generation through library models - Multiple test flows in one test program - Multiple devices in one test program family - Easy and fast DUT / test data entry via maps - Global and local test parameters map - Change test parameters on fly without source code re-compiling

VRAD is at the core of the operating system for SPEA semiconductor testers. The program is designed for rapid program generation, saving on development time and cost.

VRAD generates test programs according to device specifications, automatically editing the source code. It incorporates an easy-to- use, Excel-based library of test models that lets test engineers focus on the tests to be performed, instead of writing the operating code for the system.

The programmer has just to enter the DUT testing information, and the sequence of tests that are already available in the test library. Once the test list is complete, the programmer introduces the parameters of the tests for the specific DUT.

With these simple inputs, VRAD gives you in output the test program code to run the tester, in accurate and fast way.

The library is the very core of the generation process. It includes ready-to-use, validated models for each component type. Each model in the library is designed to be used by all the devices in the family type which the library refers to.

Faster time-to-market, development cost reduction. VRAD library models streamline development and debugging, speeding time-to-market while saving on development cost. The use of the testers for the test program debug is minimized, while the test engineer can save a great deal on time and effort. The leadtime reduction of robust test programs, since from the first silicon, allows a very fast delivery of the product.

Standard test programs provide greatest efficiency. VRAD library models, based on common standards, guarantee the readableness of your source code, improving communication among project participations. The work can be easily split between different people or even between different geographical locations.

- Reduced test development time
- Improved test programs quality
- Increased work productivity
- Minimized debug on the tester
- Efficient test program maintenance