SPEA's automatic mixed signal test platform hardware and software architecture is open, modular, scalable and flexible: PC performance independent, automatic C++ code generation and 16 wire synchronized bus insure best time to market. Complete and reliable, from bench top tester to 2000+ pin m/s automatic test platforms, MEMS rate table & integrated pick & place system, Comptest MX series delivers answers for the test challenges of tomorrow.
With PerPin instrumentation, 88 universal slots, up to 2,048 channels, the systems can perform the parametric and functional test of cost-sensitive as well as complex and sophisticated systems-on-a-chip (SoCs), systems in package (SiP), MEMS and power devices, including the parallel multi-site testing of multiple devices.
The test head universal slots can be equipped with a range of instruments: digitizers, arbitrary waveform generators, counters, analog & digital channels, and low power generators.
Programmable logic units per pin are available for loading dedicated test functions, parallel test on each pin, asynchronous device test.