SPEA C600MX is designed to provide high performance and high throughput in testing system-on-a-chip and system-in-a-package devices, while maintaining low cost of test.

The high number of channels and generator/measurement units allows the Multi-Site real parallel test, to address the time-to-market of the product with a very high productivity.The scalable and modular platform architecture allows you to easily modify/extend the system instrumentation with different modules, to meet your new test requirements.

Universal Slots

The universal slots in the C600MX test head can be equipped with a complete set of instrumentation: digitizers, arbitrary waveform generators, counters, analog & digital channels, and low power generators.
The open and scalable system architecture (hardware and software) allows an easy modification and/or integration of the instrumentation, in order to meet changes in production and new test requirements.

Analog/Digital Channels Programmable Logic Units TMU

The C600MX systems can be equipped with up to 2048 analog/digital channels (up to 200 MHz pattern rate) and 512 PLU channels (Programmable Logic Units), for speeding up the test execution and/or loading dedicated functions in order to satisfy the specific test requirements of the device under test.

The measurements can be performed in parallel on each pin, and asynchronous devices can be tested.

Multiple Digitizers with DSP & Arbitrary Signal Generator

Multiple channel digitizers DSP instrumentation & arbitrary signal generator units can be installed for the multiple signal generation and the analog acquisition for the real parallel test.

Low Power Generators

The C600MX 4-quadrant V/I Source & Measurement Units force and measure voltage of ±20 V and current of ±40 mA. .

Medium Power Generators

The C600MX 4-quadrant V/I Source & Measurement Units force and measure voltage up to ±120 V and current up to ±2 A.

High Power Generators

The C600MX systems are able to perform the test of power devices (as MOSFET, IGBT, diodes) in parallel, thanks to the high voltage/power generators that can be equipped (up to 8).

RF Functions

The C600MX The C600MX can be either equipped with one or more RF generator (RF rack integration), or with PXI modules to accomodate RF instruments (PXI based instrument integration).

C600MX series Features & Benefits

Software for data collection, processing and analysis 

	Very Rapid Applications Development - Device Data Map Editor - Test Plan Map Editor - Bin Maps - Test Model Libraries - Pattern Data Import from simulator - Automatic Test Program Generation - Documentation and report generation
Software for production - Standard operator control panel - Real time in-line yield monitor - Retest on fail - Statistic production process data analysis - Sampling on the fly - Bin alert - Delta site yield alert
	Software for debugging - Instrument setting change on the fly - Shmoo plot (bi- or tridimensional) - Characterization - Virtual debugger by event view - Vector change on the fly - Acquisition memory display

The ATOSC2 system software allows you to develop and debug the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development).

The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input.

The Automatic Test Program Generation is fast, thanks to structures based on family test libraries.

- Pin count: up to 2048 (analog, digital or mixed-signal)
- Digital channels: up to 2048
- True per pin system architecture
- Multi-Site test capability (synchron and asynchron)
- Channel frequency ranges: up to 50 MHZ or up to 200 MHz
- Multiple Digitizer & DSP for real time data acquisition & processing
- High resolution AC generators
- 4-quadrant PPMU (V/I force & measurement unit)
- Up to 512 PLU (Programmable Logic Unit) Per Pin
- TMU (Timing Measurement Unit) Per Pin
- Up to 32 medium power V/I sources (±120 V; ±2 A)
- Up to 8 high power sources (±100 V; ±400 A)
- Up to 4 high voltage V/I sources (±2500 V)
- Up to 128 V/I sources (±8 V; ±200 mA)
- RF generators up to 3 GHz
- PXI based instrumentation

- Sensors
- Automotive
- Analog & Digital devices
- Power management devices
- Battery chargers
- Lighting and LEDs drivers
- MEMS devices 

*The digital channels cover 2 frequence ranges
-Up to 50 MHz
-Up to 200 MHz