Ready to test all your smart card modules

The CT1000 systems are able to test both contact and contactless smart card, and can also test dual interface devices (integrating both contact and contactless card chips in a single modules).

The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use the common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFAREｪ, DESFIREｪ, FeliCaｪ, ISO 11784/85, ICodeｪ, Hitagｪ, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.

LF/HF Test Frequency: 125kHz ÷ 13.56MHz
UHF Test Frequency: 800 MHz ÷ 1 GHz

The CT1000 can be equipped with a SAM interface module, for a state-of-the-art security level during RFID device testing.

No compromise - Short test time for ultra accurate measurement

The CT1000 series latest-technology analog instrumentation allows for the reduction of the test time, and performs extremely accurate measurements. 
The DVM units are capable of data treatment and mathematical calculations on the acquired values. This ensures accurate measurements with no compromise in the data exchange either for single site or multi-site parallel measurements.

Multisite Parallel Test

The CT1000 testers perform high-parallel test at low cost: each CT module can test 32 synchronous or asynchronous devices in parallel.
Moreover, the CT1000 testers have been designed to be connected in parallel, in order to test more than 32 sites.

Open/Short/Leakage preliminary tests

In order to guarantee the reliability, consistency and reproducibility of the results, the CT1000 can perform preliminary tests such as open, short and leakage test, and verify if the contact is done correctly. 

Capacitance/Inductance measurement

The CT1000 systems can perform the accurate capacitance/inductance measurement, verifying the smart card input signal when the RFID pad is contacted. In this way, it is possible to test the correct working of the device before assembling, detecting faults not identifiable at the final test. 

Test of passive devices

The CT1000 systems can check the presence of passive devices, such as capacitors, resistors, resonators.

Final test

The CT1000 systems test the smart card communication conditions with the common standard protocols (ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, Mifare™, Desfire™, FeliCa™,  ISO 11784/85, ICode™, Hitag™,  ISO 7816, ISO 7813), and are ready to test also the next generation of smart card protocol, such as USB-Keys, MMC, Micro-SD (without CPU inside), M-SIM, HD-SIM, SIM-WAVE and I²C. Besides, also completely customized protocols can be tested.

RFID device test with antenna

CT1000 testers can verify the real working distance of contactless RFID devices. The systems is equipped with antenna to read data from and write data to an RFID tag via radio, generating programmable magnetic fields.

Signal clearness and strength

CT1000 can measure the retro modulation depth, to evaluate the clearness and strength/quality of the answer signal provided by the component under test.

The ATOSC2 system software allows you to develop and debug the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development).

The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input.

The Automatic Test Program Generation is fast, thanks to structures based on family test libraries.

Software for data collection, processing and analysis 

	Very Rapid Applications Development - Device Data Map Editor - Test Plan Map Editor - Bin Maps - Test Model Libraries - Pattern Data Import from simulator - Automatic Test Program Generation - Documentation and report generation
Software for production - Standard operator control panel - Real time in-line yield monitor - Retest on fail - Statistic production process data analysis - Sampling on the fly - Bin alert - Delta site yield alert
	Software for debugging - Instrument setting change on the fly - Shmoo plot (bi- or tridimensional) - Characterization - Virtual debugger by event view - Vector change on the fly - Acquisition memory display