The PMTC 100 is a complete industrial solution to the production test of IGBT semiconductor power modules for automotive applications. This integrated test cell provides a turn-key solution for the automated handling, contacting and testing of these products, with the capability to force and measure the very high currents (up to 1000 A) and voltages (up to 2500 V) required for a complete, reliable test.

SPEA Power Module Test Cell 

High Power Test Capabilities

The tester module of the PMTC 100 accomodates analog, digital and power instrumentation to perform parametric and functional tests on the devices.
The high power instrumentation allows the performance of all the tests required for the IGBT modules (such as insulation and breakdown), applying very high currents (up to 1000 A) and voltages (up to 2500 V).

Full Automation

The test cell is easily integrated in the production environment, without needing the manual loading/ unloading of the power modules.
The automation module performs the in-line handling of the products, according to the SMEMA standard. It can be equipped with input/output conveyors.

Easy Configurability

The PMTC 100 can be flexibly configured to optimally adapt to the production environment and requirements:

- The products can be transported in either direction (left-to-right or right-to-left)
- The handling speed and direction are programmable by software, without requiring mechanical operations

Fast Setup Change

The PMTC 100 is able to contact modules of any regular or irregular shape:

- The contacting unit can access the product from the top, from the bottom or from the side
- It is extremely easy and immediate to replace the application on the machine

Easy of use

The PMTC 100 is easy-to-use: the system control unit uses a single operator interface for the entire test cell management. The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. The test program generation and debug are fast, thanks to the VRAD (Very Rapid Application Development) functionality, based on structured family test libraries.

Software for data collection, processing and analysis 

	Very Rapid Applications Development - Device Data Map Editor - Test Plan Map Editor - Bin Maps - Test Model Libraries - Pattern Data Import from simulator - Automatic Test Program Generation - Documentation and report generation
Software for production - Standard operator control panel - Real time in-line yield monitor - Retest on fail - Statistic production process data analysis - Sampling on the fly - Bin alert - Delta site yield alert
	Software for debugging - Instrument setting change on the fly - Shmoo plot (bi- or tridimensional) - Characterization - Virtual debugger by event view - Vector change on the fly - Acquisition memory display

The ATOSC2 system software allows you to develop and debug the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development).

The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input.

The Automatic Test Program Generation is fast, thanks to structures based on family test libraries.