|
The UNITEST 500ADP is the most complete model created for In-Circuit, parametric and functional testing on modules containing analog, digital, and/or power supply boards. The analog power instrumentation module includes programmable AC-DC generators, programmable active loads, HV generators and a power matrix.
Thanks to the versatility guaranteed by the GAX architecture, it is possible to use the instrumentation in parallel, making the UNITEST 500ADP a high performance test system for testing multiple modules at one time. This gives the user the flexibility to apply the best test strategy in relation to the type and volume of products to be tested. Equipped with hybrid channels, the UNITEST 500ADP can test of analog, digital and hybrid devices and boards.
The UNITEST 500ADP is capable of performing over 700 measurements per second without affecting the accuracy, repeatability and measurement stability. The digital test vectors, applied via direct or multiplexed channels, can be executed at speeds up to 10MHz with different values of voltages compatible with TTL, CMOS or ECL technologies.
The UNITEST 500ADP is the only test system in the world with the capability to execute in-circuit test, analog signal test, power test, digital test and mixed signal test in one test station. Thanks to the bed of nails interface, top and bottom, it is possible the test of a large range of boards and electronic modules (ballast, power supplies, digital board, multiprocessor. Etc.).
|
 |
|
The UNITEST 505AP is the test system created for the in-circuit, parametric and functional testing of mainly analog board and modules. The instrumentation includes programmable generators to 4 quadrants, direct analog channels, programmable active loads, and AC and/or DC generators.
The UNITEST 505AP is capable of performing over 700 measurements per second without affecting the accuracy, repeatability and measurement stability. Thanks to the polyfunctional test capability guaranteed by the hardware and software architecture, the UNITEST 505AP can be employed for the testing of a wide range of products such as power supplies, DC and AC converters and ballasts.
|
 |
|
The UNITEST 507AP is a reduced footprint test system created for the combining in-circuit test and GO / Nogo functional test. After In-Circuit testing, many electronic products require the verification of a single component or a simplified functional test in order to verify the correct start up and basic operation of the product.
The UNITEST 507AP is the tester for these situations. Examples of applications of the UNITEST 507AP are the testing of emergency lamps, controllers for domestic appliances, and simple microcrontroller boards. The parallel / Multi-site test capacity of UNITEST 507AP allows a significant reduction of the unit test cost.
|
 |
|
The UNITEST 505HV is an In-Circuit, parametric, and functional equipped test system with analog instrumentation as on the Unitest 505AP but added with a High voltage generator capable of generating up to 5000V.
The UNITEST 505HV allows the combination in one polyfunctional test station In-Circuit, parametric, functional and HV test. This type of test is typically required for products connected to the power line and/or products which require hypot testing.
|
|