SPEA engages itself with creativity and innovation in designing and manufacturing the most suitable test equipment -
the most advanced, most reliable, most convenient - for testing semiconductors and electronic boards.

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 New Minimize
Complete solution for IGBT Power Module Production Test

 SPEA launches the PMTC 100  integrated Power Module Test Cell

Tri-temp rate tables for MEMS test

Rotation/acceleration stimulus for accelerometer and gyroscope test

Tri-temp rate tables for MEMS test
MULTI-MEMS TEST

Complete and combined test of multi-function MEMS devices on single equipment

MULTI-MEMS TEST
New Tray-To-Reel Handling for MEMS Test Cells

All SPEA MEMS test cells can now be equipped with the new reel sorting unit option

New Tray-To-Reel Handling for MEMS Test Cells
High-Throughput Tri-Temp MEMS Test Cell

SPEA announces the launch of the first test cell for the tri-temp test of high-production MEMS devices

High-Throughput Tri-Temp MEMS Test Cell

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 Events Minimize
Electronics Midwest

September 28-30, 2010 - Rosemont, Illinois

GEM Expo Brazil

October 5-7, 2010 - Sao Paulo, Brazil

SMTAI

October 26-27, 2010 - Orlando, Florida

Matelec

October 26-30, 2010 - Madrid, Spain

Electronica

November 9-12, 2010 - Munich, Germany


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